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1

[ASME ASME Turbo Expo 2015: Turbine Technical Conference and Exposition - Montreal, Quebec, Canada (Monday 15 June 2015)] Volume 4B: Combustion, Fuels and Emissions - Premixed Pilot Flames for Improved Emissions and Flexibility in a Heavy Duty Gas Turbine Combustion System

York, William D., Romig, Bryan W., Hughes, Michael J., Simons, Derrick W., Citeno, Joseph V.

Year:

2015

Language:

english

File:

PDF, 2.04 MB

english, 2015

2

Studies of interfacial segregation in the analytical electron microscope: A brief review

D.B. Williams, A.D. Romig Jr.

Journal:

Ultramicroscopy

Year:

1989

Language:

english

File:

PDF, 1.61 MB

english, 1989

3

Effects of UV-B Radiation Levels on Concentrations of Phytosterols, Ergothioneine, and Polyphenolic Compounds in Mushroom Powders Used As Dietary Supplements

Sapozhnikova, Yelena, Byrdwell, William Craig, Lobato, Amada, Romig, Bill

Journal:

Journal of Agricultural and Food Chemistry

Year:

2014

Language:

english

File:

PDF, 716 KB

english, 2014

4

Meta-Analysis of Prompt and Duration for Curriculum-Based Measurement of Written Language

Romig, John Elwood, Miller, Alexandra A., Therrien, William J., Lloyd, John W.

Journal:

Year:

2020

File:

PDF, 1.73 MB

2020

5

Definition of the spatial resolution of X-ray microanalysis in thin foils

D.B. Williams, J.R. Michael, J.I. Goldstein, A.D. Romig Jr.

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 757 KB

english, 1992

6

Factors differentiating the commercialization of disruptive and sustaining technologies

Kassicieh, S.K., Walsh, S.T., Cummings, J.C., McWhorter, P.J., Romig, A.D., Williams, W.D.

Journal:

IEEE Transactions on Engineering Management

Year:

2002

Language:

english

File:

PDF, 571 KB

english, 2002

7

The 2003 Air Medical Leadership Congress: Findings and recommendations

Frank Thomas, Kenneth Robinson, Tom Judge, Connie Eastlee, Eileen Frazer, Stephen H Thomas, Laurie Romig, Ira Blumen, Reed Brozen, Ken Williams, Eric R Swanson, Stephen Hartsell, Jill Johnson, Kevin H

Journal:

Air Medical Journal

Year:

2004

Language:

english

File:

PDF, 369 KB

english, 2004

8

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || || Front_matter

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 877 KB

english, 1990

9

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Basic SEM Imaging

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.14 MB

english, 1990

10

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Electron Beam Parameters

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.36 MB

english, 1990

11

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Backscattered Electron Imaging

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 929 KB

english, 1990

12

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Scanning Transmission Imaging in the SEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 440 KB

english, 1990

13

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Light Element Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 885 KB

english, 1990

14

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Stereo Microscopy

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.21 MB

english, 1990

15

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Image Contrast and Quality

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.21 MB

english, 1990

16

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Energy-Dispersive X-Ray Spectrometry

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.11 MB

english, 1990

17

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || High-Resolution SEM Imaging

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.19 MB

english, 1990

18

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || SE Signal Components

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.11 MB

english, 1990

19

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Wavelength-Dispersive X-Ray Spectrometry and Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 972 KB

english, 1990

20

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Quantitative Energy-Dispersive X-Ray Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.44 MB

english, 1990

21

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Low-Voltage SEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 811 KB

english, 1990

22

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Trace Element Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 956 KB

english, 1990

23

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Particle and Rough Surface Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 980 KB

english, 1990

24

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Energy-Dispersive X-Ray Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 2.12 MB

english, 1990

25

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Electron Channeling Contrast

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.19 MB

english, 1990

26

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Voltage Contrast and EBIC

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.06 MB

english, 1990

27

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Magnetic Contrast

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 573 KB

english, 1990

28

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Environmental SEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 837 KB

english, 1990

29

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Quantitative Wavelength-Dispersive X-Ray Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.29 MB

english, 1990

30

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Computer-Aided Imaging

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.31 MB

english, 1990

31

A model for the blocking of trains

Bodin, Lawrence D., Golden, Bruce L., Schuster, Allan D., Romig, William

Journal:

Transportation Research Part B: Methodological

Year:

1980

Language:

english

File:

PDF, 471 KB

english, 1980

32

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || X-Ray Images

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.11 MB

english, 1990

33

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || X-Ray Microanalysis in the AEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1011 KB

english, 1990

34

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Scanning Transmission Imaging in the AEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 784 KB

english, 1990

35

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Electron Energy Loss Spectrometry

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.07 MB

english, 1990

36

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Convergent Beam Electron Diffraction

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 876 KB

english, 1990

37

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Bulk Specimens for SEM and X-Ray Microanalysis

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 2.53 MB

english, 1990

38

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Thin Specimens for TEM and AEM

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.56 MB

english, 1990

39

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy || Coating Methods

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 1.37 MB

english, 1990

40

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy ||

Lyman, Charles E., Goldstein, Joseph I., Romig, Alton D., Echlin, Patrick, Joy, David C., Newbury, Dale E., Williams, David B., Armstrong, John T., Fiori, Charles E., Lifshin, Eric, Peters, Klaus-Rued

Year:

1990

Language:

english

File:

PDF, 877 KB

english, 1990

41

[IEEE 2000 IEEE Engineering Management Society. EMS - 2000 - Albuquerque, NM, USA (13-15 Aug. 2000)] Proceedings of the 2000 IEEE Engineering Management Society. EMS - 2000 (Cat. No.00CH37139) - A model for technology assessment and commercialization for innovative disruptive technologies

Kassicieh, S.K., Anderson, S.W., Romig, A., Cummings, J., McWhorter, P., Williams, D.

Year:

2000

Language:

english

File:

PDF, 466 KB

english, 2000

42

[PICMET - Portland State Univ PICMET '01. Portland International Conference on Management of Engineering and Technology. Technology Management in the Knowledge Era. Selected Papers - Portland, OR, USA (29 July-2 Aug. 2001)] PICMET '01. Portland International Conference on Management of Engineering and Technology. Proceedings Vol.1: Book of Summaries (IEEE Cat. No.01CH37199) - An empirical analysis of differences between sustaining and disruptive technology innovations

Kassicieh, S.K., Walsh, S.T., Romig, A., Cummings, J., McWhorter, P., Williams, D.

Year:

2001

Language:

english

File:

PDF, 646 KB

english, 2001

43

[PICMET - Portland State Univ PICMET'01. Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries - Portland, OR, USA (29 July-2 Aug. 2001)] PICMET '01. Portland International Conference on Management of Engineering and Technology. Proceedings Vol.1: Book of Summaries (IEEE Cat. No.01CH37199) - An empirical analysis of differences between sustaining and disruptive technology innovations

Kassicieh, S.K., Walsh, S.T., Romig, A., Cummings, J., McWhorter, P., Williams, D.

Year:

2001

Language:

english

File:

PDF, 113 KB

english, 2001

44

Recombinants of a Defective Lysogen of Staphylococcal Strains

Wentworth, Berttina B., Romig, William R.

Journal:

Japanese Journal of Microbiology

Year:

1968

Language:

english

File:

PDF, 1.05 MB

english, 1968

45

The Multiplication of Staphylococcal Phages in Nonpermissive Hosts

Wentworth, Berttina B., Romig, William R.

Journal:

Japanese Journal of Microbiology

Year:

1968

Language:

english

File:

PDF, 1.13 MB

english, 1968

46

The 2003 Air Medical Leadership CongressFindings and recommendations

THOMAS, F, ROBINSON, K, JUDGE, T, EASTLEE, C, FRAZER, E, THOMAS, S, ROMIG, L, BLUMEN, I, BROZEN, R, WILLIAMS, K

Journal:

Air Medical Journal

Year:

2004

Language:

english

File:

PDF, 369 KB

english, 2004

47

Application of Real-Time 3-Dimensional Transesophageal Echocardiography in the Percutaneous Closure of a Mitral Paravalvular Leak

Azran, Marc S., Romig, Christopher B., Locke, Andrew, Whitley, William S.

Journal:

Anesthesia & Analgesia

Year:

2010

Language:

english

File:

PDF, 402 KB

english, 2010